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51 results found in all.
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46Dual-constraint burst image denoising method
Author(s):Dan ZHANG, Lei ZHAO, Duanqing XU, Dongming LU  Clicked:5273  Download:4144  Cited:0  <Full Text>  <PPT> 393
Frontiers of Information Technology & Electronic Engineering  2022 Vol.23 No.2 P.220-233  DOI:10.1631/FITEE.2000353
47Multi-agent differential game based cooperative synchronization control using a data-driven method
Author(s):Yu SHI, Yongzhao HUA, Jianglong YU, Xiwang DONG, Zhang REN  Clicked:1901  Download:3098  Cited:0  <Full Text>  <PPT> 296
Frontiers of Information Technology & Electronic Engineering  2022 Vol.23 No.7 P.1043-1056  DOI:10.1631/FITEE.2200001
48Scalability and efficiency challenges for the exascale supercomputing system: practice of a parallel supporting environment on the Sunway exascale prototype system
Author(s):Xiaobin HE, Xin CHEN, Heng GUO, Xin LIU, Dexun CHEN, Yuling YANG, Jie GAO, Yunlong FENG, Longde CHEN, Xiaona DIAO, Zuoning CHEN  Clicked:1281  Download:1756  Cited:0  <Full Text>  <PPT> 235
Frontiers of Information Technology & Electronic Engineering  2023 Vol.24 No.1 P.41-58  DOI:10.1631/FITEE.2200412
49A distributed EEMDN-SABiGRU model on Spark for passenger hotspot prediction
Author(s):Dawen XIA, Jian GENG, Ruixi HUANG, Bingqi SHEN, Yang HU, Yantao LI, Huaqing LI  Clicked:1074  Download:424  Cited:0  <Full Text>  <PPT> 143
Frontiers of Information Technology & Electronic Engineering  2023 Vol.24 No.9 P.1316-1331  DOI:10.1631/FITEE.2200621
50Automatic parallelism strategy generation with minimal memory redundancy
Author(s):Yanqi SHI, Peng LIANG, Hao ZHENG, Linbo QIAO, Dongsheng LI  Clicked:156  Download:140  Cited:0  <Full Text>
Frontiers of Information Technology & Electronic Engineering  In Press    DOI:
51Parallel fault diagnosis using hierarchical fuzzy Petri net by reversible and dynamic decomposition mechanism
Author(s):Yinhong XIANG, Kaiqing ZHOU, Arezoo SARKHEYLI-HÄGELE, Yusliza YUSOFF, Diwen KANG, Azlan Mohd ZAIN  Clicked:17  Download:15  Cited:0  <Full Text>
Frontiers of Information Technology & Electronic Engineering  In Press    DOI:
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